Thorough materials analysis
Combining the molecular and structural information of Raman spectroscopy with the chemical information of XPS permits greater sample understanding
Probing deeper
While XPS remains the master of the surface, Raman allows additional insights into the material properties below the surface
Perfect for thin films
Graphenes, boron nitrides, etc. XPS already presents the ideal resource for chemical and thickness analysis of thin films - with Raman providing insights into defects and film structure
Integrated software
Our integrated Raman system provides data in OMNIC/CSV format - ready to be analysed by widely used softwares